Journal
IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES
Volume 33, Issue 1, Pages 178-183Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TCAPT.2009.2038488
Keywords
Carbon nanotubes; electrical noise; thermal resistance
Ask authors/readers for more resources
A carbon nanotube (CNT) thermometer that operates on the principles of electrical shot noise is reported. Shot noise thermometry is a self-calibrating measurement technique that relates statistical fluctuations in dc current across a device to temperature. A structure consisting of vertical, top, and bottom-contacted single-walled carbon nanotubes in a porous anodic alumina template was fabricated and used to measure shot noise. Frequencies between 60 and 100 kHz were observed to preclude significant influence from 1/f noise, which does not contain thermally relevant information. Because isothermal models do not accurately reproduce the observed noise trends, a self-heating shot noise model has been developed and applied to experimental data to determine the thermal resistance of a CNT device consisting of an array of vertical single-walled CNTs supported in a porous anodic alumina template. The thermal surface resistance at the nanotube-dielectric interface is found to be 1.5 x 10(8) K/W, which is consistent with measurements by other techniques.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available