Journal
IEEE SENSORS JOURNAL
Volume 13, Issue 9, Pages 3343-3344Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JSEN.2013.2273572
Keywords
IC testing; MOSFET; temperature sensor
Funding
- EUFeder
- Spanish MICINN [TEC2008-01856]
- AGAUR SGR [1497]
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This letter proposes a new sensor circuit to measure on-chip low-frequency temperature changes that have information about electrical high-frequency figures of merit of a radio frequency (RF) circuit. The proposed sensor circuit uses a metal-oxide-semiconductor field-effect transistor (MOSFET) as a temperature sensing device, which is then connected to a band-pass filter that amplifies the low-frequency temperature signal generated by the RF circuit under test (CUT). Simulations in 65 nm CMOS technology show that such a sensor circuit can extract the center frequency (2.47 GHz) of a RF power amplifier (PA) by measuring on-chip temperature changes at 1 kHz.
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