Journal
IEEE PHOTONICS TECHNOLOGY LETTERS
Volume 25, Issue 15, Pages 1520-1523Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LPT.2013.2270281
Keywords
Broadband photodetector; selective deposition; SiGe quantum dot; Si nanopillar
Funding
- National Science Council of Taiwan [NSC 101-3113-P-008-008]
- Dragon-gate program [NSC 99-2911-I-008-003, NSC 100-2911-I-008-018]
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We demonstrate a successful selective growth of Si0.3Ge0.7 quantum dots (QDs) over array of p(+)-Si nanopillars using a low-pressure chemical vapor deposition technique, and hereafter realized high-performance QD broadband photodiodes for visible to near-infrared photodetection based on heterostructures of indium tin oxide/Si0.3Ge0.7 QD/Si pillar. Thanks to effective hole confinement and thus a built-in electric field within the SiGe QD, high ratios of photocurrent to dark current of similar to 2200, 100, and 30, respectively, were measured on our SiGe QDs-based photodiodes under illumination of 9 mW/cm(2) at wavelength of 500-800, 1300, and 1500 nm. The QD photodiode exhibits a very low dark current density of 3.2 x 10(-8) A/cm(2) and a tunable power-dependent linearity by applied voltage through the competition of electron drift and carrier recombination processes.
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