☆ 4.4 Article

Microwave Noise and FET Devices

IEEE MICROWAVE MAGAZINE (2010)

Journal

IEEE MICROWAVE MAGAZINE

Volume 11, Issue 6, Pages 53-60

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

DOI: 10.1109/MMM.2010.937731

Keywords

Noise; Logic gates; Gallium arsenide; HEMTs; Noise measurement; Silicon

Categories

Engineering, Electrical & Electronic Telecommunications

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