☆ 4.4 Article

AlGaN/GaN HFET Reliability

IEEE MICROWAVE MAGAZINE (2009)

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Journal

IEEE MICROWAVE MAGAZINE
Volume 10, Issue 4, Pages 116-127

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/MMM.2009.932286

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Categories

Engineering, Electrical & Electronic Telecommunications

Funding

  1. AFRL (Chris Bozada and John Blevins)
  2. ONR (Paul Maki and Harry Dietrich)

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Reagent

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