Journal
IEEE JOURNAL OF SOLID-STATE CIRCUITS
Volume 48, Issue 11, Pages 2934-2943Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JSSC.2013.2282114
Keywords
Embedded DRAM; hardware counterfeit; hardware security; ID; physically unclonable functions (PUFs)
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An architecture for enabling self-authenticating chips uses 4 Kb electrically programmable fuses (eFUSE) to store bit strings representing encrypted intrinsic fingerprints obtained by offset-superimposing six out of one thousand 4 Kb domains randomly chosen in 4Mb embedded DRAM. Authentication is accomplished by regenerating various encrypted intrinsic fingerprints, which are then compared with the bit strings in the eFUSE. Monte Carlo simulations demonstrate that, targeting an average of 32 retention fails per domain, the strings are unique and authentication is statistically guaranteed without bit correction even when unstable bits are introduced. The preliminary results are confirmed in >50 parts containing 4Mb memory implemented in 22-nm SOI hardware under the target voltage +/-10% conditions. The analytical model predicts >10(20) years to crack the encryption by brute force, while satisfying > 99.9999% successful authentication for one million parts.
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