Journal
IEEE ELECTRON DEVICE LETTERS
Volume 31, Issue 6, Pages 564-566Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LED.2010.2045631
Keywords
InGaAs; temperature; traps; tunnel field-effect transistors (TFETs); vertical
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Funding
- Nanoelectronics Research Initiative through the Midwest Institute for Nanoelectronics Discovery
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We report on the experimental temperature-dependent characteristics of vertical In0.53Ga0.47 As tunnel field-effect transistors (TFETs) at low drain bias to provide key insight into its device operation and design. Leakage floor (I-OFF) is determined by the ungated p(+) -i-n(+) reverse bias leakage and is dominated by Shockley-Read-Hall generation-recombination current. The temperature dependence of subthreshold slope arises from tunneling into mid-gap states at the oxide-semiconductor interface, followed by thermal emission into the conduction band. At intermediate gate voltages, pure band-to-band tunneling dominates, while at higher gate voltages, current transport is diffusion limited. The temperature-dependent study of In0.53Ga0.47 As TFET highlights the importance of passivating the III-V and dielectric interface.
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