4.6 Article

A Novel Tungsten-Nickel Alloy Ohmic Contact to SiC at 900 °C

Journal

IEEE ELECTRON DEVICE LETTERS
Volume 31, Issue 8, Pages 791-793

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LED.2010.2050761

Keywords

Amphoteric; high temperature; nickel; ohmic contacts; silicon carbide; tungsten

Funding

  1. NASA

Ask authors/readers for more resources

A novel tungsten-nickel ohmic contact metallization on 4H-SiC and 6H-SiC capable of surviving temperatures as high as 900 degrees C is reported. Preliminary results revealed the following: 1) ohmic contact on n-type 4H-SiC having net doping levels (N-d's) of 1.4 and 2 x 10(19) cm(-3), with specific contact resistances (rho sNd)'s of 7.69 x 10(-4) and 5.81 x 10(-4) Omega . cm(2), respectively, after rapid thermal annealing (RTA), and 5.9 x 10(-3) and 2.51 x 10(-4) Omega . cm(2), respectively, after subsequent soak at 900 degrees C for 1 h in argon, and 2) ohmic contact on n- and p-type 6H-SiC having N-d > 2 x 10(19) and N-a > 1 x 10(20) cm(-3), with (rho sNd) = 5 x 10(-5) and (rho sNd) = 2 x 10(-4) Omega . cm(2), respectively, after RTA, and (rho sNd) = 2.5 x 10(-5) and (rho sNd) = 1.5 x 10(-4) Omega . cm(2) after subsequent treatment at 900 degrees C for 1 h in argon, respectively.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.6
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available