Related references
Note: Only part of the references are listed.Long term charge retention dynamics of SONOS cells
A. Arreghini et al.
SOLID-STATE ELECTRONICS (2008)
Profiling of nitride-trap-energy distribution in SONOS flash memory by using a variable-amplitude low-frequency charge-pumping technique
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IEEE ELECTRON DEVICE LETTERS (2007)
High-responsivity photodetector in standard SiGeBiCMOS technology
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IEEE ELECTRON DEVICE LETTERS (2007)
New Charge Pumping model for the analysis of the spatial trap distribution in the nitride layer of SONOS devices
A Arreghini et al.
MICROELECTRONIC ENGINEERING (2005)
An analytical retention model for SONOS nonvolatile memory devices in the excess electron state
Y Wang et al.
SOLID-STATE ELECTRONICS (2005)
Charge retention of scaled SONOS nonvolatile memory devices at elevated temperatures
YL Yang et al.
SOLID-STATE ELECTRONICS (2000)