Improvement of resistive switching in CuxO using new RESET mode

Wide dispersions of memory switching parameters are observed in resistive random access memory based on Al/CuxO/Cu structure. Moreover, the switching instability induced by these dispersions is studied. In this letter, a ramped-pulse series operation method is put forward, which can improve switching stability and cycling endurance remarkably. A method for minimizing the dispersion of V-reset by optimizing the amplitude of pulse is proposed further. The write-read-erase-read operations can be over 8 x 10(3) cycles without degradation by using the new operation mode. The role of Joule heating behind this behavior of Al/CuxO/Cu device is discussed.