4.6 Article

Reliability of active-matrix organic light-emitting-diode arrays with amorphous silicon thin-film transistor backplanes on clear plastic

Journal

IEEE ELECTRON DEVICE LETTERS
Volume 29, Issue 1, Pages 63-66

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LED.2007.910800

Keywords

active matrix; active-matrix organic ligh-temitting-diode (AMOLED) display; amorphous silicon; clear plastic; stability; thin-film transistor

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We have fabricated active-matrix organic light emitting diode (AMOLED) test arrays on an optically clear high-temperature flexible plastic substrate at process temperatures as high as 285 degrees C using amorphous silicon thin-film transistors (a-Si TFTs). The substrate transparency allows for the operation of AMOLED pixels as bottom-emission devices, and the improved stability of the a-Si TFTs processed at higher temperatures significantly improves the reliability of light emission over time.

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