4.5 Article

Resistance switching memory in perovskite oxides

Journal

ANNALS OF PHYSICS
Volume 358, Issue -, Pages 206-224

Publisher

ACADEMIC PRESS INC ELSEVIER SCIENCE
DOI: 10.1016/j.aop.2015.03.028

Keywords

Resistance switching; Memristor; Perovskite oxide; Ferroelectric tunneling junction

Funding

  1. National Natural Science Foundation of China [51301084, 51431006]
  2. National 973 Projects of China [2011CB922101]
  3. Natural Science Foundation of Jiangsu Province, China [BK20130576]

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The resistance switching behavior has recently attracted great attentions for its application as resistive random access memories (RRAMs) due to a variety of advantages such as simple structure, high-density, high-speed and low-power. As a leading storage media, the transition metal perovskite oxide owns the strong correlation of electrons and the stable crystal structure, which brings out multifunctionality such as ferroelectric, multiferroic, superconductor, and colossal magnetoresistance/electroresistance effect, etc. The existence of rich electronic phases, metal-insulator transition and the nonstoichiometric oxygen in perovskite oxide provides good platforms to insight into the resistive switching mechanisms. In this review, we first introduce the general characteristics of the resistance switching effects, the operation methods and the storage media. Then, the experimental evidences of conductive filaments, the transport and switching mechanisms, and the memory performances and enhancing methods of perovskite oxide based filamentary RRAM cells have been summarized and discussed. Subsequently, the switching mechanisms and the performances of the uniform RRAM cells associating with the carrier trapping/detrapping and the ferroelectric polarization switching have been discussed. Finally, the advices and outlook for further investigating the resistance switching and enhancing the memory performances are given. (C) 2015 Elsevier Inc. All rights reserved.

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