IEEE Design & Test

Journal Title

IEEE Design & Test

IEEE DES TEST

ISSN / eISSN

2168-2356

Aims and Scope

IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.

Subject Area

COMPUTER SCIENCE, HARDWARE & ARCHITECTURE

ENGINEERING, ELECTRICAL & ELECTRONIC

CiteScore

3.80 View Trend

CiteScore Ranking

Category	Quartile	Rank
Engineering - Electrical and Electronic Engineering	Q2	#354/797
Engineering - Hardware and Architecture	Q3	#94/177
Engineering - Software	Q3	#230/407

Web of Science Core Collection

Science Citation Index Expanded (SCIE)	Social Sciences Citation Index (SSCI)
Indexed	-

Category (Journal Citation Reports 2024)	Quartile
COMPUTER SCIENCE, HARDWARE & ARCHITECTURE	Q3
ENGINEERING, ELECTRICAL & ELECTRONIC	Q3

H-index

72

Country/Area of Publication

UNITED STATES

Publisher

IEEE Computer Society

Annual Article Volume

59

Open Access

NO

Contact

445 HOES LANE, PISCATAWAY, USA, NJ, 08855-4141