IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

Journal Title

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

IEEE T DEVICE MAT RE

ISSN / eISSN

1530-4388

Aims and Scope

The scope of the publication includes, but is not limited to Reliability of: Devices, Materials, Processes, Interfaces, Integrated Microsystems (including MEMS & Sensors), Transistors, Technology (CMOS, BiCMOS, etc.), Integrated Circuits (IC, SSI, MSI, LSI, ULSI, ELSI, etc.), Thin Film Transistor Applications. The measurement and understanding of the reliability of such entities at each phase, from the concept stage through research and development and into manufacturing scale-up, provides the overall database on the reliability of the devices, materials, processes, package and other necessities for the successful introduction of a product to market. This reliability database is the foundation for a quality product, which meets customer expectation. A product so developed has high reliability. High quality will be achieved because product weaknesses will have been found (root cause analysis) and designed out of the final product. This process of ever increasing reliability and quality will result in a superior product. In the end, reliability and quality are not one thing; but in a sense everything, which can be or has to be done to guarantee that the product successfully performs in the field under customer conditions. Our goal is to capture these advances. An additional objective is to focus cross fertilized communication in the state of the art of reliability of electronic materials and devices and provide fundamental understanding of basic phenomena that affect reliability. In addition, the publication is a forum for interdisciplinary studies on reliability. An overall goal is to provide leading edge/state of the art information, which is critically relevant to the creation of reliable products.

Subject Area

ENGINEERING, ELECTRICAL & ELECTRONIC

PHYSICS, APPLIED

CiteScore

4.80 View Trend

CiteScore Ranking

Category	Quartile	Rank
Engineering - Safety, Risk, Reliability and Quality	Q2	#65/207
Engineering - Electrical and Electronic Engineering	Q2	#274/797
Engineering - Electronic, Optical and Magnetic Materials	Q2	#103/284

Web of Science Core Collection

Science Citation Index Expanded (SCIE)	Social Sciences Citation Index (SSCI)
Indexed	-

Category (Journal Citation Reports 2024)	Quartile
ENGINEERING, ELECTRICAL & ELECTRONIC	Q2
PHYSICS, APPLIED	Q2

H-index

63

Country/Area of Publication

UNITED STATES

Publisher

Institute of Electrical and Electronics Engineers Inc.

Publication Frequency

Quarterly

Annual Article Volume

72

Open Access

NO

Contact

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 445 HOES LANE, PISCATAWAY, USA, NJ, 08855-4141